Illumination/ Viewing System |
Reflectance: |
di:8°, de:8° (diffused illumination, 8° viewing), SCI (Specular Component Included) / SCE (Specular Component Excluded) switchable. |
Conforms to CIE No.15, lSO7724/1, ASTM E1164, DIN 5033 Teil7, and JIS Z 8722 condition c standards |
Integrating Sphere Size |
Ø152 mm (6 inches) |
Detector |
Dual 40-element silicon photodiode arrays |
Spectral Separation Device |
Diffraction grating |
Wavelength Range |
360 to 740 nm |
Wavelength Pitch |
10 nm |
Half Bandwidth |
approx. 10 nm |
Reflectance |
0 to 200% |
Range |
Resolution: 0.01% |
Light Source |
1 Pulsed xenon lamps |
Illumination / Measurement Area |
LAV: Ø30.0 mm / Ø25.4 mm |
MAV: Ø11.0 mm / Ø8.0 mm |
SAV: Ø7.0 mm / Ø4.0 mm |
Repeatability |
Colorimetric values: Standard deviation within ΔE*ab 0.03 |
Spectral reflectance: Standard deviation within 0.1% |
(When a white calibration plate is measured 30 times at 10-second intervals after white calibration) |
Inter-Instrument Agreement |
Within ΔE*ab 0.15 |
(Based on average for 12 BCRA Series II color tiles; LAV/SCI. Compared to values measured with master body under Konica Minolta standard measurement conditions) |
UV Setting |
No adjustment function (UV 100%) |
Measurement Time |
Approx. 3.5 second (SCI+SCE measurement) |
Minimum Interval Between Measurements |
Approx. 4 second (SCI+SCE measurement) |
Sample Viewer Function |
Using internal camera |
|
(Image viewable/copiable using optional software such as SpectraMagic NX software Ver. 3.2 or later) |
Internal Performance Check*2 |
WAA (Wavelength Analysis & Adjustment) Technology |
Interface |
USB 2.0 |
Target Mask Auto Detection |
Yes |
Power |
Dedicated AC adapter |
Operating temperature / humidity range |
13 to 33°C, Relative humidity: 80% or less (at 35°C) with no condensation |
Storage temperature / humidity range |
0 to 40°C, Relative humidity: 80% or less (at 35°C) with no condensation |
Size (W x H xD) |
Approx. 248 x 250 x 498 mm |
Weight |
Approx. 8.3 kg |